Inicio » Soluciones y Servicios » Scanning Electron Microscope Characterization Analysis Service (UHR FEI HELIOS NANOLAB 600)
Detailed characterization of the surface of the materials
Observation of surface texture and topography
Observation magnifications from 25 to 500,000x magnification
Particle size measurement (5nm-500mm)
EDS for elemental chemical analysis on the surface of materials (penetration 1.0 -2 mm)
Location of regions with different chemical composition (chemical mapping)
Contáctanos y podemos ayudarte a encontrar la herramienta que mejor se adapte a tu proyecto,
All rights reserved
Camino a la Presa San José 2055. Col. Lomas 4 sección CP. 78216, San Luis Potosí S.L.P.
Tel: (444) 834 20 00 Ext 7327
ott@ipicyt.edu.mx
What is gob.mx?
It is the single portal for procedures, information and citizen participation. Read more