Characterization analysis service in the Atomic Force Microscope (AFM JEOL JSPM 5200)

3D surface characterization of flat materials
1,200.00 MXN Academic Price
$1,750.00 MXN Company Price
/ per session

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3D surface characterization of flat materials

Obtaining topographic images in 2D and 3D obtaining measurements below 3 Angstroms

Determination of mechanical properties

Sample homogeneity analysis

Particle size analysis

Necesidades que resuelve

Analysis of biological materials, drugs, foods, metals, ceramics, thin films, crystals, powders, paints, nano particles, nano materials, alloys, etc.
Determination of thickness in thin films or deposits
Areas such as medicine, health sciences, nanotechnology, materials science, automotive industry, metal industry, welding, etc.

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