Characterization analysis service in the scanning electron microscope (ESEM FEI FEG QUANTA 250)

2,200.00 MXN Academic Price
$3,250.00 MXN Company Price
/ Price per session

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Detailed surface characterization of materials

Observation of surface texture and topography

Observation magnifications between 25 and 500,000x magnification

Particle size measurement (5nm-500mm)

EDS for elemental chemical analysis on the surface of materials (penetration 1.0 -2 mm)

Location of regions with different chemical composition (chemical mapping)

Necesidades que resuelve

Characterization of the surface of the finished product
Detection of micro- and nanofractures
Chemical identification of impurities
Analysis in regions with defects
Measurement of oxidation regions for quality control
Thickness measurement
Identification of mineral phases

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