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Ion Erosion Depth Profile Characterization Analysis Service (Thin Films Only) (XPS)

Surface chemical characterization
10,000.00 MXN
/ Price per sample
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Descripción

Surface chemical characterization (<10 nm)
Elemental composition (atomic percentages)
Non-destructive composition profile (angular XPS)
Composition profile in thin films with ion erosion (up to 1mm depth)

Necesidades que resuelve

Chemical modification of the surface
Corrosion or oxidation
Chemical composition to determine properties in materials
Determine thickness and uniformity of coatings
Check quality of finished product

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