Inicio » Soluciones y Servicios » Scanning Electron Microscope Characterization Analysis Service (ESEM FEI QUANTA 200)
Detailed characterization of the surface of the materials
Observation of surface texture and topography
Observation magnifications from 25 to 500,000x magnification
Particle size measurement (5nm-500mm) EDS for elemental chemical analysis on the surface of materials (penetration 1.0 -2 mm)
Location of regions with different chemical composition (chemical mapping)
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Camino a la Presa San José 2055. Col. Lomas 4 sección CP. 78216, San Luis Potosí S.L.P.
Tel: (444) 834 20 00 Ext 7327
ott@ipicyt.edu.mx
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