Scanning Electron Microscope Characterization Analysis Service (ESEM FEI QUANTA 200)

Detailed surface characterization of materials
1,750.00 MXN Academic Price:
$2,800.00 MXN Company Price
/ Price per session

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Detailed characterization of the surface of the materials

Observation of surface texture and topography

Observation magnifications from 25 to 500,000x magnification

Particle size measurement (5nm-500mm) EDS for elemental chemical analysis on the surface of materials (penetration 1.0 -2 mm)

Location of regions with different chemical composition (chemical mapping)

Necesidades que resuelve

Characterization of the surface of the finished product
Detection of micro and nanofractures
Chemical identification of impurities
Analysis in regions with defects
Measurement of oxidation regions for quality control
Thickness measurement
Identification of mineral phases

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