Ion Erosion Depth Profile Characterization Analysis Service (Thin Films Only) (XPS)
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Surface chemical characterization
Characterization analysis service in the Atomic Force Microscope (AFM JEOL JSPM 5200)
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3D surface characterization of flat materials
Characterization analysis service by XPS, ARXPS, UPS, Mapping (elemental and composition)
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Surface chemical characterization
Characterization analysis service in the X-ray Diffractometer (XDR SmartLab RIGAKU)
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Qualitative and semiquantitative identification of crystalline compounds.
Characterization analysis service in the spectrophotometer (MICRO RAMAN RENISHAW)
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Provides chemical and structural information about materials
Hardness Analysis Service (Vickers)
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Measurement of the resistance of a material when penetrated
Characterization analysis service in the scanning electron microscope (ESEM FEI FEG QUANTA 250)
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Characterization analysis service in the transmission electron microscope, (TEM JEOL 200 CX)
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Information is obtained about the size and shape of the nanostructures
Scanning Electron Microscope Characterization Analysis Service (ESEM FEI QUANTA 200)
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Detailed surface characterization of materials
Physical Property Measurement System (PPMS) characterization analysis service.
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Measurement of magnetic moment of a solid sample